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Updated: Aug 22, 2026

Probing C84-embedded Si Substrate Using Scanning Probe Microscopy and Molecular Dynamics
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Published on: September 28, 2016

Determination of interface states for CaF2/Si(111) from near-edge x-ray-absorption measurements

Himpsel, Karlsson, Morar

    Physical Review Letters
    |April 7, 1986
    PubMed
    Abstract

    No abstract available in PubMed .

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