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Updated: Oct 24, 2026

All-electronic Nanosecond-resolved Scanning Tunneling Microscopy: Facilitating the Investigation of Single Dopant Charge Dynamics
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All-electronic Nanosecond-resolved Scanning Tunneling Microscopy: Facilitating the Investigation of Single Dopant Charge Dynamics

Published on: January 19, 2018

Direct observation of Friedel oscillations around incorporated SiGa dopants in GaAs by low-temperature scanning

van der Wielen MC, van Roij AJ, van Kempen H

    Physical Review Letters
    |February 12, 1996
    PubMed
    Abstract

    No abstract available in PubMed .

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