Jove
Visualize
Contact Us
JoVE
x logofacebook logolinkedin logoyoutube logo
ABOUT JoVE
OverviewLeadershipBlogJoVE Help Center
AUTHORS
Publishing ProcessEditorial BoardScope & PoliciesPeer ReviewFAQSubmit
LIBRARIANS
TestimonialsSubscriptionsAccessResourcesLibrary Advisory BoardFAQ
RESEARCH
JoVE JournalMethods CollectionsJoVE Encyclopedia of ExperimentsArchive
EDUCATION
JoVE CoreJoVE BusinessJoVE Science EducationJoVE Lab ManualFaculty Resource CenterFaculty Site
Terms & Conditions of Use
Privacy Policy
Policies

Related Experiment Videos

High resolution electron backscatter diffraction with a field emission gun scanning electron microscope.

F J Humphreys1, I Brough

  • 1Manchester Materials Science Centre, Grosvenor Street, Manchester M1 7HS, U.K. john.humphreys@umist.ac.uk

Journal of Microscopy
|August 12, 1999
PubMed
Summary
This summary is machine-generated.

Related Concept Videos

You might also read

Related Articles

Articles linked to this work by shared authors, journal, and citation graph.

Sort by
Same author

Study of dynamic grain growth by electron microscopy and EBSD.

Journal of microscopy·2009
Same author

The influence of low-strain thermo-mechanical processing on grain boundary network characteristics in type 304 austenitic stainless steel.

Journal of microscopy·2008
Same author

Recrystallization phenomena in an IF steel observed by in situ EBSD experiments.

Journal of microscopy·2008
Same author

The characterization of low-angle boundaries by EBSD.

Journal of microscopy·2005
Same author

A study of recrystallization in single-phase aluminium using in-situ annealing in the scanning electron microscope.

Journal of microscopy·2004
Same author

Quantifying recrystallization by electron backscatter diffraction.

Journal of microscopy·2004
Same journal

In operando imaging of the space-charge region in a 4H-SiC MOSCAP using STEM-EBIC.

Journal of microscopy·2026
Same journal

The future of DXA: How AI is transforming bone health diagnostics.

Journal of microscopy·2026
Same journal

The Origins of Ploem's Filter Cube: A Pandora's Box.

Journal of microscopy·2026
Same journal

The reproducibility gap in graph neural network workflows for cell dynamics: A checklist-driven case study.

Journal of microscopy·2026
Same journal

Assessing the reproducibility of a bioimage analysis workflow characterising tissue flow in Drosophila.

Journal of microscopy·2026
Same journal

Modular training resources for bioimage analysis.

Journal of microscopy·2026
See all related articles

A thermal field emission scanning electron microscope (FEGSEM) significantly enhances electron backscatter diffraction performance. This advanced microscope offers threefold improvement in spatial resolution and optimized angular accuracy for materials analysis.

Area of Science:

  • Materials Science
  • Electron Microscopy
  • Crystallography

Background:

  • Conventional scanning electron microscopes (W-filament) have limitations in electron backscatter diffraction (EBSD) performance.
  • Optimizing EBSD requires high spatial resolution and angular accuracy for detailed microstructural analysis.

Purpose of the Study:

  • To evaluate the performance of a thermal field emission gun scanning electron microscope (FEGSEM) for electron backscatter diffraction (EBSD).
  • To compare FEGSEM EBSD capabilities against conventional W-filament scanning microscopes.

Main Methods:

  • Utilized a thermal field emission gun scanning electron microscope (FEGSEM).
  • Conducted electron backscatter diffraction (EBSD) analyses.
  • Varied probe currents (50-300 nA) and accelerating voltages (10-30 keV) to determine optimal parameters.

Related Experiment Videos

Main Results:

  • FEGSEM demonstrated approximately a threefold improvement in spatial resolution compared to conventional microscopes.
  • Optimal spatial resolution was achieved at probe currents of 50-300 nA and 10-15 keV.
  • Enhanced angular accuracy was observed at probe currents above 150 nA and 30 keV.

Conclusions:

  • Thermal field emission gun scanning electron microscopy (FEGSEM) offers superior performance for electron backscatter diffraction (EBSD).
  • FEGSEM provides significantly improved spatial resolution and angular accuracy, crucial for advanced materials characterization.