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Source point calibration from an arbitrary electron backscattering pattern.

Krieger Lassen NC1

  • 1Materials Research Department, Risø National Laboratory, PO Box 49, DK-4000 Roskilde, Denmark.

Journal of Microscopy
|August 25, 1999
PubMed
Summary
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A new method accurately locates the source point in electron backscattering patterns (EBSPs) without prior indexing. This technique simplifies crystal orientation measurements by using arbitrary Kikuchi bands and basic crystallographic data.

Area of Science:

  • Materials Science
  • Crystallography
  • Electron Microscopy

Background:

  • Accurate source point localization is crucial for geometric analysis of electron backscattering patterns (EBSPs).
  • Current computational methods rely on pre-indexed Kikuchi bands, posing challenges when the source point is imprecisely known.

Purpose of the Study:

  • To develop a novel technique for determining the source point position from arbitrary electron backscattering patterns (EBSPs).
  • To overcome the limitations of existing calibration methods that require precise initial source point knowledge for band indexing.

Main Methods:

  • A new computational procedure is introduced to determine the source point location using band positions from any EBSP.
  • The method requires only the positions of Kikuchi bands and standard crystallographic information for indexing.

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Main Results:

  • The technique successfully determined the source point in patterns from both simple cubic crystals (requiring four bands) and orthorhombic BiSCCO superconductors (requiring five bands).
  • Source point calculation is rapid, taking approximately one minute on a standard personal computer after band localization.

Conclusions:

  • This novel technique provides a robust and efficient solution for source point determination in EBSPs.
  • It simplifies crystal orientation measurements and other geometrically dependent analyses by eliminating the need for precise initial source point estimation.