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Updated: Oct 19, 2026

Microfluidic Chips for In Situ Crystal X-ray Diffraction and In Situ Dynamic Light Scattering for Serial Crystallography
Published on: April 24, 2018
Crystallographic orientation assessment by electron backscattered diffraction
F Cléton1, P H Jouneau, S Henry
1CIME, Ecole Polytechnique Fédérale de Lausanne, Switzerland.
Abstract:
With an angular orientation accuracy of at least 1 , the ability of electron backscattered diffraction (EBSD) to determine and emphasise crystallographic orientation is illustrated. Using the abilities of specially developed software for computing Euler angles derived from the scanned specimen, misorientations are pointed out with acceptable flexibility and graphic output through crystallographic orientation maps or pole figures. This ability is displayed in the particular case of laser cladding of nickel-based superalloy, a process that combines the advantages of a near net-shape manufacturing and a close control of the solidification microstructure (E-LMF: epitaxial laser metal forming).
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