Jove
Visualize
Contact Us
JoVE
x logofacebook logolinkedin logoyoutube logo
ABOUT JoVE
OverviewLeadershipBlogJoVE Help Center
AUTHORS
Publishing ProcessEditorial BoardScope & PoliciesPeer ReviewFAQSubmit
LIBRARIANS
TestimonialsSubscriptionsAccessResourcesLibrary Advisory BoardFAQ
RESEARCH
JoVE JournalMethods CollectionsJoVE Encyclopedia of ExperimentsArchive
EDUCATION
JoVE CoreJoVE BusinessJoVE Science EducationJoVE Lab ManualFaculty Resource CenterFaculty Site
Terms & Conditions of Use
Privacy Policy
Policies

Related Experiment Videos

Proximal electromagnetic shear forces.

Ayars1, Aspnes, Moyer

  • 1Physics Department, North Carolina State University, Raleigh, NC 27695-8202, U.S.A.

Journal of Microscopy
|December 14, 1999
PubMed
Summary
This summary is machine-generated.

Related Concept Videos

You might also read

Related Articles

Articles linked to this work by shared authors, journal, and citation graph.

Sort by
Same author

Enhancement of CsNO3 extraction in 1,2-dichloroethane by tris(2-aminoethyl)amine triamide derivatives via a dual-host strategy

Analytical chemistry·2000
Same author

Binding Cesium Ions with Nucleosides: Templated Self-Assembly of Isoguanosine Pentamers This research was supported by the Separations and Analysis Program, Division of Chemical Sciences, Office of Basic Energy Sciences, U.S. Department of Energy. J.T.D. thanks the Dreyfus Foundation for a Teacher-Scholar Award. We thank Drs. Bryan Eichhorn, Steve Rokita, and Lyle Isaacs for advice.

Angewandte Chemie (International ed. in English)·2000
Same author

The backbone of nursing--more nominees

Nursing spectrum (D.C./Baltimore metro ed.)·1999
Same author

Photoinduced structural changes in amorphous As2S3 as measured by differential anomalous x-ray scattering.

Physical review. B, Condensed matter·1995
Same author

Real-time observation of atomic ordering in (001) In0.53Ga0.47As epitaxial layers.

Physical review letters·1995
Same author

Surface-Induced Optical Anisotropies of Single-Domain (2 x 1) Reconstructed (001) Si and Ge Surfaces.

Physical review letters·1995
Same journal

In operando imaging of the space-charge region in a 4H-SiC MOSCAP using STEM-EBIC.

Journal of microscopy·2026
Same journal

The future of DXA: How AI is transforming bone health diagnostics.

Journal of microscopy·2026
Same journal

The Origins of Ploem's Filter Cube: A Pandora's Box.

Journal of microscopy·2026
Same journal

The reproducibility gap in graph neural network workflows for cell dynamics: A checklist-driven case study.

Journal of microscopy·2026
Same journal

Assessing the reproducibility of a bioimage analysis workflow characterising tissue flow in Drosophila.

Journal of microscopy·2026
Same journal

Modular training resources for bioimage analysis.

Journal of microscopy·2026
See all related articles

Electromagnetic forces from charged tips are negligible in shear force imaging. Calculations show these forces are significantly lower than experimental observations, confirming they do not impact imaging results.

Area of Science:

  • Physics
  • Materials Science
  • Nanotechnology

Background:

  • Shear force microscopy is a key technique for nanoscale imaging.
  • Understanding tip-sample interactions is crucial for accurate imaging.
  • Electromagnetic forces are potential interactions in tip-sample systems.

Purpose of the Study:

  • To calculate the magnitude of electromagnetically induced shear forces.
  • To determine the relevance of these forces in shear force imaging.

Main Methods:

  • A simple model calculation was employed.
  • The study estimated shear force from current dissipation.
  • Parameters typical for shear force imaging were used.

Main Results:

Related Experiment Videos

  • The calculated electromagnetic shear force is many orders of magnitude lower than reported experimental values.
  • Proximal electromagnetic tip-sample forces were found to be negligible.

Conclusions:

  • Electromagnetic tip-sample forces do not need to be considered in shear force imaging.
  • The findings simplify the interpretation of shear force microscopy data.