Micro-thermal analysis: scanning thermal microscopy and localised thermal analysis

Area of Science:

• Materials Science
• Analytical Chemistry
• Surface Science

Background:

• Atomic Force Microscopy (AFM) provides high-resolution topographical imaging.
• Characterizing thermal properties at the microscale is crucial for understanding material behavior.
• Conventional AFM lacks integrated thermal analysis capabilities.

Purpose of the Study:

• To introduce and detail the methodology of micro-thermal analysis.
• To demonstrate the combination of AFM imaging with localized thermal and chemical analysis.
• To highlight the versatility of the apparatus for various material characterization techniques.

Main Methods:

• Replacing the conventional AFM tip with a miniature heater/thermometer for thermal imaging.
• Utilizing modulated temperature calorimetry and thermomechanical analysis for localized thermal studies.
• Employing pyrolysis gas chromatography-mass spectrometry and photothermal infrared spectrometry for spatially resolved chemical analysis.

Main Results:

• Micro-thermal analysis allows visualization of surfaces based on thermal response, in addition to topography.
• Localized thermal and dynamic mechanical measurements can be performed with high spatial resolution.
• Spatially resolved chemical analysis is achievable using the same apparatus.

Conclusions:

• Micro-thermal analysis offers a powerful, integrated approach for comprehensive material characterization.
• The technique provides high-resolution insights into thermal, mechanical, and chemical properties.
• This method expands the scope of AFM beyond topography to include functional material properties.