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Updated: Jul 9, 2026

Using Synchrotron Radiation Microtomography to Investigate Multi-scale Three-dimensional Microelectronic Packages
Published on: April 13, 2016
Three-dimensional atomic-scale imaging of impurity segregation to line defects
Blavette1, Cadel, Fraczkiewicz
1Sonde Atomique et Microstructures, Groupe de Metallurgie Physique, UMR CNRS 6634, Faculte des Sciences de Rouen, Universite de Rouen, 76821 Mont-Saint-Aignan Cedex, France.
Abstract:
Clouds of impurity atoms near line defects are believed to affect the plastic deformation of alloys. Three-dimensional atom probe techniques were used to image these so-called Cottrell atmospheres directly. Ordered iron-aluminum alloys (40 atomic percent aluminum) doped with boron (400 atomic parts per million) were investigated on an atomic scale along the <001> direction. A boron enrichment was observed in the vicinity of an <001> edge dislocation. The enriched region appeared as a three-dimensional pipe 5 nanometers in diameter, tangent to the dislocation line. The dislocation was found to be boron-enriched by a factor of 50 (2 atomic percent) relative to the bulk. The local boron enrichment is accompanied by a strong aluminum depletion of 20 atomic percent.
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