Atomic force microscopy imaging of polycrystalline CuInSe2 thin films

Alberts1, Hillie, Demanet

  • 1Department of Physics, Rand Afrikaans University, PO Box 524, Auckland Park, Johannesburg 2006, South Africa.

Journal of Microscopy
|January 29, 2000
PubMed
Summary

Atomic force microscopy (AFM) reveals structural differences in copper indium selenide (CuInSe2) films used in solar cells. Optimized growth techniques yield dense films with narrow grain distributions, crucial for high-efficiency devices.