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Field-emission cold-cathode el source for a microscale ion trap mass spectrometer
Analytical Chemistry
|March 1, 2000
Abstract:
A cold-cathode electron impact ionization source based on field emission from an array of diamond-coated silicon whiskers is described. The source is coupled to a microscale ion trap mass spectrometer (r0 = 0.50 mm, z0 = 0.50 mm). An electron beam of 250 nA could be obtained through the 0.45-mm diameter opening in the end cap electrode.
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