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Field-emission cold-cathode el source for a microscale ion trap mass spectrometer

Kornienko1, Reilly, Whitten

  • 1Oak Ridge National Laboratory, Tennessee 37831-6142, USA.

Analytical Chemistry
|March 1, 2000
PubMed
Summary
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A novel cold-cathode electron source using diamond-coated silicon whiskers was developed. This electron impact ionization source is integrated with a microscale ion trap mass spectrometer, achieving a 250 nA electron beam.

Area of Science:

  • Materials Science
  • Analytical Chemistry
  • Physics

Background:

  • Development of compact and efficient electron sources is crucial for miniaturized analytical instruments.
  • Field emission electron sources offer potential for low-power, high-brightness electron beams.

Purpose of the Study:

  • To describe a novel cold-cathode electron impact ionization source.
  • To integrate this source with a microscale ion trap mass spectrometer.
  • To characterize the performance of the electron beam generated.

Main Methods:

  • Fabrication of a cold-cathode electron source utilizing field emission from diamond-coated silicon whiskers.
  • Coupling the electron source to a microscale ion trap mass spectrometer (r0 = 0.50 mm, z0 = 0.50 mm).
  • Measurement of the electron beam current through the end cap electrode aperture.

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Main Results:

  • Successful operation of a cold-cathode electron source based on field emission.
  • Achieved an electron beam current of 250 nA.
  • Demonstrated integration with a microscale ion trap mass spectrometer.

Conclusions:

  • The developed diamond-coated silicon whisker array serves as an effective cold-cathode electron source.
  • The source is compatible with microscale mass spectrometry systems.
  • The electron beam characteristics are suitable for ionization in micro-mass spectrometers.