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The physical significance of the mixed dynamic form factor
Schattschneider1, Nelhiebel, Souchay
1Institut fur Angewandte und Technische Physik, Technische Universitat Wien, Vienna, Austria. schatt@email.tuwien.ac.at
Micron (Oxford, England : 1993)
|March 31, 2000
Abstract:
We show that the mixed dynamic form factor for inelastic scattering of fast electrons in crystals is closely related to the density matrix of the probe electron and to that of the scatterer. With this insight it is possible to calculate both energy filtered diffraction patterns and energy spectroscopic high-resolution images. As an example we discuss the Si-K and -L edges.