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Updated: Jul 24, 2026

Probing Surface Electrochemical Activity of Nanomaterials using a Hybrid Atomic Force Microscope-Scanning Electrochemical Microscope (AFM-SECM)
Published on: February 10, 2021
Facilitated tip-positioning and applications of non-electrode tips in scanning electrochemical microscopy using a
A Hengstenberg1, C Kranz, W Schuhmann
1Analytische Chemie, Elektroanalytik und Sensorik Ruhr-Universität Bochum, Germany.
Abstract:
In scanning electrochemical microscopy (SECM) a microelectrode is usually scanned over a sample without following topographic changes (constant-height mode). Therefore, deconvolution of effects from distance variations arising from non-flat sample surface and electrochemical surface properties is in general not possible. Using a shear force-based constant distance mode, information about the morphology of a sample and its localized electrochemical activity can be obtained simultaneously. The setup of the SECM with integrated constant-distance mode and its application to non-flat or tilted surfaces, as well as samples with three-dimensional surface structures are presented and discussed. The facilitated use of non-amperometric tips in SECM like enzyme-filled glass capillaries is demonstrated.
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