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Updated: Aug 4, 2026

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Electrospray Deposition of Uniform Thickness Ge23Sb7S70 and As40S60 Chalcogenide Glass Films
Published on: August 19, 2016
The dependence of equilibrium film thickness on grain orientation at interphase boundaries in ceramic-ceramic
1Department of Materials Science and Metallurgy, University of Cambridge, UK. kmk10@cam.ac.uk
Ultramicroscopy
|June 7, 2000
Abstract:
High-resolution transmission electron microscope observations of hexagonal boron nitride - 3C silicon carbide interphase boundaries suggest that where one or more phases is highly anisotropic, an orientation dependence on equilibrium film thickness can arise. Theoretical considerations of this phenomenon in terms of the equilibrium thickness of an amorphous film between two crystalline media are consistent with the trend seen experimentally.

