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Updated: Jul 16, 2026

Methods of Ex Situ and In Situ Investigations of Structural Transformations: The Case of Crystallization of Metallic Glasses
Published on: June 7, 2018
Electronic structure of mott insulators studied by inelastic X-ray scattering
1Department of Applied Physics, Stanford Synchrotron Radiation Laboratory (SSRL), and Stanford Linear Accelerator Center (SLAC), Stanford University, Stanford, CA 94305, USA. Bell Laboratories, Lucent Technologies, Murray Hill, NJ 07974, US.
Abstract:
The electronic structure of Mott insulators continues to be a major unsolved problem in physics despite more than 50 years of research. Well-developed momentum-resolved spectroscopies such as photoemission or neutron scattering cannot probe the full Mott gap. High-resolution resonant inelastic x-ray scattering revealed dispersive charge excitations across the Mott gap in a high-critical temperature parent cuprate (Ca(2)CuO(2)Cl(2)), shedding light on the anisotropy of the Mott gap. These charge excitations across the Mott gap can be described within the framework of the Hubbard model.
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