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Updated: Oct 16, 2026

Applying X-ray Imaging Crystal Spectroscopy for Use as a High Temperature Plasma Diagnostic
06:46

Applying X-ray Imaging Crystal Spectroscopy for Use as a High Temperature Plasma Diagnostic

Published on: August 25, 2016

A new needle-crystalline computed radiography detector

P Leblans1, L Struye, P Willems

  • 1Agfa-Gevaert NV, Mortsel, Belgium. leblans@twi.agfa.be

Journal of Digital Imaging
|June 10, 2000
PubMed

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