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Related Experiment Videos

Triplet-phase measurements using reference-beam X-ray diffraction.

Q Shen1, S Kycia, I Dobrianov

  • 1Cornell High Energy Synchrotron Source (CHESS), Cornell University, Ithaca, NY 14853, USA. qs11@cornell.edu

Acta Crystallographica. Section A, Foundations of Crystallography
|June 14, 2000
PubMed
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Reference-beam diffraction (RBD) is a novel X-ray technique for determining crystal structure phases. This method analyzes multiple-beam interference profiles to extract essential triplet phase data for crystallography.

Area of Science:

  • Crystallography
  • Materials Science
  • X-ray Diffraction

Background:

  • Standard X-ray diffraction methods often struggle with phase determination.
  • Phase information is crucial for accurate crystal structure determination.
  • Multiple-beam diffraction offers a pathway to overcome these limitations.

Purpose of the Study:

  • To detail the theoretical developments and experimental procedures of Reference-Beam Diffraction (RBD).
  • To demonstrate the utility of RBD for extracting triplet phases of Bragg reflections.
  • To explore the application of RBD in crystal structure determination.

Main Methods:

  • Incorporation of multiple-beam diffraction principles into oscillating-crystal methods.
  • Simultaneous recording of multiple-beam interference profiles using area detectors.

Related Experiment Videos

  • Development of automated data-analysis procedures for triplet phase extraction.

    • Main Results:

    • Successful application of RBD to various crystals including GaAs, lysozyme, and quasicrystals.
    • Demonstrated ability to determine a large number of triplet phases from experimental data.
    • Validation of RBD using both image plates and CCD detectors.

    Conclusions:

    • RBD is a powerful phase-sensitive technique for crystallography.
    • The developed theoretical framework and experimental procedures facilitate accurate phase determination.
    • RBD holds significant promise for future crystal structure determination and materials analysis.