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Quantification of boundary segregation in the analytical electron microscope

Keast1, Williams

  • 1Department of Materials Science and Metallurgy, Cambridge University, Pembroke Street, Cambridge, CB2 3QZ, U.K., Department of Materials Science and Engineering, Whitaker Lab 5, Lehigh University, Bethlehem, PA 18015, USA.

Summary

Accurate quantification of grain-boundary segregation using scanning transmission electron microscopy requires careful modeling of the electron beam-specimen interaction volume. Optimizing experimental parameters like electron energy and rastering can improve detection limits and accuracy.

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