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In Situ SIMS and IR Spectroscopy of Well-defined Surfaces Prepared by Soft Landing of Mass-selected Ions
Published on: June 16, 2014
Substrate Morphology and Particle Adhesion in Reacting Systems
1Department of Chemical, Bio and Materials Engineering, Arizona State University, Tempe, Arizona, 85287
Abstract:
This paper describes an effort to measure and model changes in the adhesion of micron-scale particles to substrates in systems in which chemical reactions are occurring. Contact interactions between polystyrene latex spheres and silicon substrates (with surface oxide) immersed in aqueous KNO(3) solutions were studied. Two important results were obtained. First, it was shown that the AFM can be employed to monitor, in situ, changes in adhesive interactions induced by surface chemical reactions in this system. Second, the morphology of the interacting surfaces plays a controlling role in particle adhesion. In particular, for this system, changes in roughness of the substrate changed the interaction force by nearly 90%. Copyright 2000 Academic Press.
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