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Updated: Aug 4, 2026

Micro/Nano-scale Strain Distribution Measurement from Sampling Moiré Fringes
06:56

Micro/Nano-scale Strain Distribution Measurement from Sampling Moiré Fringes

Published on: May 23, 2017

X-ray diffraction moiré topography as a means to reconstruct relative displacement fields in weakly deformed

Ohler1, Köhler, Härtwig

  • 1European Synchrotron Radiation Facility, BP 220, F-38043 Grenoble, France, and Arbeitsgruppe Röntgenbeugung, Institut für Physik, Humboldt-Universität Berlin, Hausvogteiplatz 5-7, D-10117 Berlin, Germany.

Acta Crystallographica. Section A, Foundations of Crystallography
|August 6, 2000
PubMed

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