Structure refinement of Cu8GeS6 using X-ray diffraction data from a multiple-twinned crystal. Erratum
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Updated: Oct 15, 2026

Microfluidic Chips for In Situ Crystal X-ray Diffraction and In Situ Dynamic Light Scattering for Serial Crystallography
Published on: April 24, 2018
1National Institute for Research in Inorganic Materials, Namiki 1-1, Tsukuba, Ibaraki 305-0044, Japan. onodam@nirim.go.jp
Abstract:
An error in the figures is reported. In the paper by Onoda et al. [Acta Cryst. (1999), B55, 721-725] the figures are given in the wrong order. Fig. 1 on p. 723 should in fact be Fig. 2 on p. 724 and vice versa. The figure captions are given correctly.
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