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Updated: May 6, 2026

Probing and Mapping Electrode Surfaces in Solid Oxide Fuel Cells
Published on: September 20, 2012
1Department of Materials and Interfaces, Weizmann Institute of Science, Rehovot, Israel.
This study introduces controlled surface charging, a novel, non-destructive X-ray photoelectron spectroscopy (XPS) method for precise nanometre-scale depth profiling of thin material layers. The technique accurately determines atomic positions within mesoscopic heterostructures.
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