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Updated: Jul 28, 2026

Ohmic Contact Fabrication Using a Focused-ion Beam Technique and Electrical Characterization for Layer Semiconductor Nanostructures
08:12

Ohmic Contact Fabrication Using a Focused-ion Beam Technique and Electrical Characterization for Layer Semiconductor Nanostructures

Published on: December 5, 2015

Metal-semiconductor nanocontacts: silicon nanowires

Landman1, Barnett, Scherbakov

  • 1School of Physics, Georgia Institute of Technology, Atlanta, Georgia 30332-0430, USA.

Physical Review Letters
|September 6, 2000
PubMed

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