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Additive noise properties of active matrix flat-panel imagers
M Maolinbay1, Y El-Mohri, L E Antonuk
1Department of Radiation Oncology, University of Michigan Medical Center, Ann Arbor 48109, USA. manat@umich.edu
Medical Physics
|September 13, 2000
Summary
This study models additive noise in active matrix flat-panel imagers (AMFPIs), detailing noise sources like TFT thermal and photodiode shot noise. Model predictions closely matched experimental results for AMFPI noise characterization.
Area of Science:
- Medical Imaging Physics
- Electronic Engineering
- Semiconductor Device Physics
Background:
- Active matrix flat-panel imagers (AMFPIs) are crucial for indirect detection imaging.
- Understanding additive noise is essential for optimizing AMFPI performance.
- Existing models may not fully capture the complex noise contributions within AMFPIs.
Purpose of the Study:
- To develop a comprehensive theoretical model for additive noise in AMFPIs.
- To empirically validate the model by measuring various noise components.
- To identify the dominant noise sources across different operating conditions.
Main Methods:
- Developed an equivalent-noise-circuit model for AMFPIs.
- Identified and categorized noise components: pixel, data line thermal, preamplifier, and digitization noise.
- Conducted experimental measurements on a prototype AMFPI and discrete components.
Main Results:
- Model predictions for total additive noise, pixel noise, preamplifier noise, and data line thermal noise agreed well with measurements.
- Pixel noise is dominated by photodiode/TFT shot and 1/f noise for frame times > 1s.
- TFT thermal noise becomes dominant at shorter frame times, validating its inclusion in the model.
Conclusions:
- The developed theoretical model accurately represents additive noise in AMFPIs.
- The model successfully incorporates key noise contributors, including TFT thermal noise.
- Experimental validation confirms the model's predictive power for AMFPI noise analysis.