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Statistical properties of barkhausen noise in thin Fe films
1Istituto Nazionale per la Fisica della Materia, Dipartimento di Fisica, Politecnico di Milano, P.za L. da Vinci 32-20133 Milano, Italy.
Physical Review Letters
|September 16, 2000
Abstract:
The statistical properties of Barkhausen noise in an epitaxial Fe film grown on MgO have been characterized with magneto-optical Kerr effect measurements. The data reveal that magnetization reversal takes place via sudden jumps between a discrete number of randomly distributed magnetic configurations. The smallest jumps occur on a scale length of 10 &mgr;m and their amplitude distribution can be fitted with a power law: P(DeltaM) = DeltaM-alpha with alpha = 1.1 and DeltaM spanning over several decades.