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Ohmic Contact Fabrication Using a Focused-ion Beam Technique and Electrical Characterization for Layer Semiconductor Nanostructures
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Published on: December 5, 2015

Structure and electronic properties of MoS2 nanotubes

Seifert1, Terrones, Terrones

  • 1Theoretische Physik, Universitat-GH Paderborn, 33098 Paderborn, Germany.

Physical Review Letters
|September 16, 2000
PubMed

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