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Cooling Rate Dependent Ellipsometry Measurements to Determine the Dynamics of Thin Glassy Films
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Using temperature to tune film roughness: nonintuitive behavior in a simple system

Stoldt1, Caspersen, Bartelt

  • 1Departments of Chemistry, Mathematics, and Ames Laboratory, Iowa State University, Ames, Iowa 50011, USA.

Physical Review Letters
|September 16, 2000
PubMed
Summary

Thin-film growth of silver (Ag) on Ag(100) shows complex roughness changes with temperature. A transition from mound to self-affine growth occurs around 135 K, explained by an atomistic model.

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Area of Science:

  • Surface science
  • Materials science
  • Condensed matter physics

Background:

  • Ag(100) homoepitaxy is a fundamental system for studying thin-film deposition.
  • Understanding thin-film growth dynamics is crucial for materials development.

Purpose of the Study:

  • To investigate the complex temperature-dependent roughness variations in Ag(100) homoepitaxy.
  • To identify the growth mechanisms and transitions occurring during thin-film formation.

Main Methods:

  • Experimental deposition of 25-monolayer Ag films on Ag(100) at varying temperatures (50 K to 300 K).
  • Analysis of film roughness as a function of deposition temperature.
  • Development and application of an atomistic model to simulate growth mechanisms.

Main Results:

  • Observed non-monotonic roughness variation with decreasing deposition temperature: increase, decrease, then increase again.
  • Identified a growth mode transition from mound formation to self-affine (semifractal) growth around 135 K.
  • The atomistic model quantitatively reproduced the experimental roughness data.

Conclusions:

  • The roughness evolution in Ag(100) homoepitaxy is highly complex and temperature-sensitive.
  • A specific temperature marks a transition in growth mechanisms, impacting film morphology.
  • An atomistic model successfully captures the underlying physics of this complex thin-film growth.