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Updated: Aug 3, 2026

10:54
Cryo-electron Microscopy Specimen Preparation By Means Of a Focused Ion Beam
Published on: July 26, 2014
Selective specimen preparation for TEM observation of the cross-section of individual carbon nanotube/metal junctions
1Max-Planck-lnstitut fur Metallforschung, Seestrasse, Stuttgart, Germany. weib@rpi.edu
Ultramicroscopy
|October 3, 2000
Abstract:
We present here an efficient method to prepare a transmission electron microscopy (TEM) specimen for selective observation of the cross-section of individual nanoscale structures. As a typical example, the cross-sectional TEM observation of a quasi-one-dimensional material - a nano-electronic component based on an individual carbon nanotube - is presented.
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