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In Situ SIMS and IR Spectroscopy of Well-defined Surfaces Prepared by Soft Landing of Mass-selected Ions
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In Situ SIMS and IR Spectroscopy of Well-defined Surfaces Prepared by Soft Landing of Mass-selected Ions

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Angular studies of potential electron emission in the interaction of slow ions with Al surfaces

Riccardi1, Barone, Bonanno

  • 1Laboratorio IIS, Dipartimento di Fisica, Universita della Calabria, and INFM Unita di Cosenza, 87036 Arcavacata di Rende, Cosenza, Italy.

Physical Review Letters
|October 4, 2000
PubMed

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