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Updated: Jul 18, 2026

Angle-resolved Photoemission Spectroscopy At Ultra-low Temperatures
Published on: October 9, 2012
Atomic quadrupolar photoemission asymmetry parameters from a solid state measurement
1Physics Department, University of Warwick, Coventry CV4 7AL, United Kingdom.
A new method uses condensed thin films to measure dipole-quadrupole interference in core-level photoemission. This technique offers advantages over gas-phase measurements for determining asymmetry parameters.
Area of Science:
- Atomic and Molecular Physics
- Surface Science
- X-ray Spectroscopy
Background:
- Core-level photoemission is sensitive to electron and photon interactions.
- Dipole-quadrupole interference influences photoemission asymmetry.
- Measuring this interference is crucial for understanding electronic structure.
Purpose of the Study:
- To propose a novel method for measuring the asymmetry parameter gamma.
- To utilize condensed thin films for enhanced measurement sensitivity.
- To investigate dipole-quadrupole interference in core-level photoemission.
Main Methods:
- Employing condensed thin films for X-ray standing wave field absorption.
- Monitoring photoemission to detect asymmetry.
- Applying the method to C, O, and F 1s photoemission at ~3 keV photon energies.
Main Results:
- Successfully measured the asymmetry parameter gamma in C, O, and F 1s photoemission.
- Demonstrated the advantages of condensed thin films over gas-phase measurements.
- Showed that the combined nondipole asymmetry factor (delta+gamma/3) for non-s states can be determined.
Conclusions:
- The proposed method provides an effective way to measure dipole-quadrupole interference.
- Condensed thin films offer a practical and advantageous approach for such measurements.
- This technique advances the study of electron and photon interactions in materials.
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