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Writing and Low-Temperature Characterization of Oxide Nanostructures
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Writing and Low-Temperature Characterization of Oxide Nanostructures

Published on: July 18, 2014

Weak localization, hole-hole interactions, and the "Metal"-insulator transition in two dimensions

Simmons1, Hamilton, Pepper

  • 1Cavendish Laboratory, University of Cambridge, Madingley Road, Cambridge CB3 OHE, United Kingdom and Semiconductor Nanofabrication Facility, University of New South Wales, Sydney 2052, Australia.

Physical Review Letters
|October 6, 2000
PubMed

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