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The statistical kinematical theory of X-ray diffraction as applied to reciprocal-space mapping

Nesterets1, Punegov

  • 1Department of Theoretical and Computing Physics, Syktyvkar State University, Oktyabrskii pr. 55, 167001 Syktyvkar, Russia. nester@ssu. komi.com.

Acta Crystallographica. Section A, Foundations of Crystallography
|November 4, 2000
PubMed
Summary

A new statistical kinematical X-ray diffraction theory describes reciprocal-space maps from deformed crystals. This method provides general solutions for scattered intensity components, aiding defect analysis in materials science.

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