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Ohmic Contact Fabrication Using a Focused-ion Beam Technique and Electrical Characterization for Layer Semiconductor Nanostructures
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Solitary current-density patterns in thin ZnS:Mn films

Zuccaro1, Niedernostheide, Kukuk

  • 1Institute of Applied Physics,University of Munster, Corrensstrasse 2 - 4, 48149 Munster, Germany.

Physical Review. E, Statistical Physics, Plasmas, Fluids, and Related Interdisciplinary Topics
|November 23, 2000
PubMed

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