Jove
Visualize
Contact Us
JoVE
x logofacebook logolinkedin logoyoutube logo
ABOUT JoVE
OverviewLeadershipBlogJoVE Help Center
AUTHORS
Publishing ProcessEditorial BoardScope & PoliciesPeer ReviewFAQSubmit
LIBRARIANS
TestimonialsSubscriptionsAccessResourcesLibrary Advisory BoardFAQ
RESEARCH
JoVE JournalMethods CollectionsJoVE Encyclopedia of ExperimentsArchive
EDUCATION
JoVE CoreJoVE BusinessJoVE Science EducationJoVE Lab ManualFaculty Resource CenterFaculty Site
Terms & Conditions of Use
Privacy Policy
Policies

Related Experiment Videos

Adhesion artefacts in atomic force microscopy imaging

Paredes1, Martinez-Alonso, Tascon

  • 1Instituto Nacional del Carbon, CSIC, La Corredoria s/n, Apartado 73, 33080 Oviedo, Spain.

Journal of Microscopy
|December 7, 2000
PubMed
Summary
This summary is machine-generated.

Related Concept Videos

You might also read

Related Articles

Articles linked to this work by shared authors, journal, and citation graph.

Sort by
Same author

The rate of accumulation of nonnucleoside reverse transcriptase inhibitor (NNRTI) resistance in patients kept on a virologically failing regimen containing an NNRTI*.

HIV medicine·2011
Same author

Molecular-dynamics simulation of two-dimensional thermophoresis

Physical review. E, Statistical physics, plasmas, fluids, and related interdisciplinary topics·2000
Same author

Discovery of a high-energy gamma-ray-emitting persistent microquasar

Science (New York, N.Y.)·2000
Same author

On the radical brook rearrangement. Reactivity of alpha-silyl alcohols, alpha-silyl alcohol nitrite esters, and beta-haloacylsilanes under radical-forming conditions

The Journal of organic chemistry·2000
Same author

Quebrada jaguay: early south american maritime adaptations

Science (New York, N.Y.)·1998
Same author

Zeta Potential as a Tool to Characterize Plasma Oxidation of Carbon Fibers

Journal of colloid and interface science·1997
Same journal

In operando imaging of the space-charge region in a 4H-SiC MOSCAP using STEM-EBIC.

Journal of microscopy·2026
Same journal

The future of DXA: How AI is transforming bone health diagnostics.

Journal of microscopy·2026
Same journal

The Origins of Ploem's Filter Cube: A Pandora's Box.

Journal of microscopy·2026
Same journal

The reproducibility gap in graph neural network workflows for cell dynamics: A checklist-driven case study.

Journal of microscopy·2026
Same journal

Assessing the reproducibility of a bioimage analysis workflow characterising tissue flow in Drosophila.

Journal of microscopy·2026
Same journal

Modular training resources for bioimage analysis.

Journal of microscopy·2026
See all related articles

Atomic force microscopy (AFM) artefacts in aramid fibres are caused by surface chemistry and topography. New methods uncouple these forces for accurate imaging and measurements.

Area of Science:

  • Materials Science
  • Surface Science
  • Nanotechnology

Background:

  • Atomic force microscopy (AFM) is crucial for nanoscale surface analysis.
  • Adhesion forces can introduce artefacts in AFM imaging, affecting contrast and quantitative measurements.
  • Aramid fibres, used in advanced materials, present unique challenges for AFM analysis due to their surface properties.

Purpose of the Study:

  • To investigate artefacts arising from adhesion forces in AFM images of aramid fibres.
  • To differentiate between artefacts caused by surface chemistry and topography.
  • To develop methods for removing these artefacts for more accurate analysis.

Main Methods:

  • Atomic force microscopy (AFM) was employed to image fresh and plasma-treated aramid fibres.

Related Experiment Videos

  • Analysis focused on adhesion forces and their contribution to image contrast.
  • Techniques were developed to decouple vertical and lateral force contributions.
  • Main Results:

    • Artefacts in AFM images of aramid fibres originate from both surface chemical variations and topographical features.
    • These artefacts result from lateral forces comparable to vertical forces, impacting image interpretation.
    • A method was successfully developed to uncouple these force contributions, eliminating artefacts.

    Conclusions:

    • The developed method allows for artefact-free AFM imaging of aramid fibres.
    • Accurate quantitative measurements can be obtained by removing adhesion force artefacts.
    • The findings are broadly applicable to AFM analysis of various materials.