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Related Experiment Videos

Orientation averaging of electron backscattered diffraction data.

F J Humphreys1, P S Bate, P J Hurley

  • 1Manchester Materials Science Centre, Grosvenor Street, Manchester M1 7HS, UK. john.humphreys@umist.ac.uk

Journal of Microscopy
|January 3, 2001
PubMed
Summary
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Data averaging using quaternion representations significantly enhances electron backscattered diffraction (EBSD) map precision. This method reliably detects subgrain misorientations in aluminium alloys after noise reduction.

Area of Science:

  • Materials Science
  • Crystallography
  • Electron Microscopy

Background:

  • Electron Backscattered Diffraction (EBSD) is crucial for analyzing material microstructures.
  • Improving angular precision in EBSD maps is essential for detailed crystallographic analysis.
  • Data averaging techniques can enhance the signal-to-noise ratio in EBSD datasets.

Purpose of the Study:

  • To discuss and demonstrate data averaging for improved angular precision in EBSD maps.
  • To introduce a novel filtering method for processing EBSD data.
  • To validate the technique's ability to detect subtle microstructural features.

Main Methods:

  • Utilized four Euler-symmetric parameters from quaternion representation for rapid orientation averaging.
  • Implemented and tested a modified Kuwahara filter for edge-preserving noise reduction.

Related Experiment Videos

  • Applied three passes of the filter to EBSD data from deformed and recovered aluminium alloys.

    • Main Results:

    • Orientation averaging using quaternion parameters proved convenient and rapid.
    • The modified Kuwahara filter effectively reduced orientation noise by approximately a factor of 10.
    • The data processing method reliably detected subgrain misorientations below 0.5 degrees.

    Conclusions:

    • Quaternion-based data averaging is an effective strategy for enhancing EBSD map angular precision.
    • The modified Kuwahara filter is a suitable tool for processing noisy EBSD data.
    • This approach enables the reliable detection of small misorientations, advancing microstructure analysis.