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Interfacial density of states in magnetic tunnel junctions
P LeClair1, J T Kohlhepp, H J Swagten
1Department of Applied Physics and COBRA, Eindhoven University of Technology, P.O. Box 513, 5600 MB Eindhoven, The Netherlands. pleclair@phys.tue.nl
Abstract:
Large zero-bias resistance anomalies as well as a collapse of magnetoresistance were observed in Co/Al2O3/Co magnetic tunnel junctions with thin Cr interfacial layers. The tunnel magnetoresistance decays exponentially with nominal Cr interlayer thickness with a length scale of approximately 1 A more than twice as fast as for Cu interlayers. The strong suppression of magnetoresistance, as well as the zero-bias anomalies, can be understood by considering a strong spin-dependent modification of the density of states at Co/Cr interfaces. The role of the interfacial density of states is shown by the use of specially engineered structures. Similar effects are predicted and observed in junctions with Ru interfacial layers.