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High-resolution electron microscope observation of interface microstructure of a cast Al-Mg-Si-Bi-Pb(6262)/Al2O3p

Z. Zhou1, Z. Fan, H. X. Peng

  • 1Laboratory of Atomic Imaging of Solids, Institute of Metal Research, Chinese Academy of Sciences, Shenyang, P. R. China; Department of Materials Engineering, Brunel University, Uxbridge, U.K.

Journal of Microscopy
|February 24, 2001
PubMed

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