Application of time delay spectrometry for rough surface characterization

This paper describes the design and performance of an ultrasound measurement system, utilizing a swept frequency excitation signal, for analyzing the backscattered signal from planar rough surfaces. The implementation is in the form of a time delay spectrometry (TDS) system operating in reflection mode whose advantages are improved signal-to-noise ratio even with low peak power relative to conventional pulse-echo methods. Because of simultaneous transmission and reception, the TDS system requires two transducers. The TDS measurement system uses a swept frequency spectrum analyzer as the central analog processing unit. Both planar piston and focused transducers in the low MHz range were used for the measurements. Due to the statistical nature of rough surface backscatter, the mean of several statistically uncorrelated measurements is required to characterize the scattering behavior of a given rough surface. Backscatter data are obtained for a series of planar rough surfaces, in the form of scattering magnitude vs. frequency and vs. incident (=backscattered) angle. Analysis of the results reveals a good correlation between the root-mean-square (RMS) height and mean backscatter magnitude at 0 degrees incident angle, and between the ratio of RMS height to correlation length and the difference in mean backscatter magnitude between 0 degrees and 5 degrees.