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Updated: Aug 4, 2026
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Carrier Lifetime Measurements in Semiconductors through the Microwave Photoconductivity Decay Method
Published on: April 18, 2019
Measurement of the lambda(+)(c) lifetime
A H Mahmood1, S E Csorna, I Danko
1University of Texas, Pan American, Edinburg 78539, USA.
Physical Review Letters
|April 6, 2001
Abstract:
The Lambda+c lifetime is measured using 9.0 fb(-1) of e+e- annihilation data collected on or just below the Upsilon(4S) resonance with the CLEO II.V detector at CESR. Using an unbinned maximum likelihood fit, the Lambda+c lifetime is measured to be 179.6+/-6.9(stat)+/-4.4(syst) fs. The precision of this colliding beam measurement is comparable to other measurements, which are based on fixed-target experiments, with different systematic uncertainties.
