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In Situ SIMS and IR Spectroscopy of Well-defined Surfaces Prepared by Soft Landing of Mass-selected Ions
Published on: June 16, 2014
State-selective optical near-field resonant ionization spectroscopy of atoms near a dielectric surface
Y Ohdaira1, K Kijima, K Terasawa
1Department of Electronics, Yamanashi University, 4-3-11, Takeda, Kofu, Yamanashi, 400-8511, Japan.
Abstract:
Spin-sensitive optical near-field microscopy and spectroscopy are proposed based on the study on the conserved quantities in optical near-field interactions of atoms with dielectric surfaces. A two-step photoionization spectra of Cs atoms resolving hyperfine structures are demonstrated near a planar dielectric surface by using evanescent waves. These techniques of state/spin-selective excitation and highly sensitive detection, combined with the techniques of optical pumping, will open up possibilities of space- and polarization-sensitive detection of optical near-fields using atomic probes. This novel method provides us with a useful technique for the observation of polarization nature of the optical near-field and controlling the spin states of mesoscopic electronic systems.
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