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Creep motion in a random-field Ising model.

L Roters1, S Lübeck, K D Usadel

  • 1Theoretische Tieftemperaturphysik, Gerhard-Mercator-Universität Duisburg, 47048 Duisburg, Germany. lars@thp.uni-duisburg.de

Summary

We numerically analyzed a moving interface in the random-field Ising model. The study details the Arrhenius behavior of interface velocity in the creep regime across 2D and 3D, comparing findings with renormalization group predictions.

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