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Creep motion in a random-field Ising model.
L Roters1, S Lübeck, K D Usadel
1Theoretische Tieftemperaturphysik, Gerhard-Mercator-Universität Duisburg, 47048 Duisburg, Germany. lars@thp.uni-duisburg.de
Summary
We numerically analyzed a moving interface in the random-field Ising model. The study details the Arrhenius behavior of interface velocity in the creep regime across 2D and 3D, comparing findings with renormalization group predictions.
Area of Science:
- Condensed matter physics
- Statistical mechanics
Background:
- The random-field Ising model describes systems with quenched disorder and magnetic interactions.
- Interfaces in such systems exhibit depinning transitions influenced by driving fields and thermal fluctuations.
Purpose of the Study:
- To numerically investigate the creep regime of a moving interface in the random-field Ising model.
- To analyze the Arrhenius law governing interface velocity dependence on temperature in 2D and 3D.
- To compare numerical findings with renormalization group predictions.
Main Methods:
- Numerical analysis of a moving interface.
- Simulation of the random-field Ising model under magnetic field driving.
- Investigation of interface dynamics at finite temperatures.
Main Results:
- The interface moves even below the critical depinning field in the creep regime.
- The interface velocity follows an Arrhenius law with temperature.
- Detailed behavior of this Arrhenius law was analyzed in 2D and 3D.
Conclusions:
- The study provides detailed numerical insights into the creep dynamics of interfaces in disordered magnetic systems.
- Numerical results offer a basis for validating theoretical models like renormalization group approaches.
- Understanding this behavior is crucial for systems exhibiting depinning transitions.