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Radio-frequency single-electron transistor as readout device for qubits: charge sensitivity and backaction
A Aassime1, G Johansson, G Wendin
1Microtechnology Center at Chalmers MC2, Department of Microelectronics and Nanoscience, Chalmers University of Technology and Göteborg University, S-412 96, Göteborg, Sweden.
Physical Review Letters
|May 1, 2001
Summary
Radio-frequency single-electron transistors (rf-SETs) can effectively read out charge qubits. Their low backaction allows for faster qubit measurements than qubit decoherence, enabling single-shot readout.
Area of Science:
- Quantum computing
- Solid-state physics
- Nanotechnology
Background:
- Charge qubits are promising for quantum computation but require sensitive readout.
- Radio-frequency single-electron transistors (rf-SETs) offer high sensitivity for detecting charge states.
Purpose of the Study:
- To evaluate the rf-SET as a readout device for charge qubits.
- To quantify the charge sensitivity and backaction of the rf-SET.
- To compare measurement time with qubit decoherence time.
Main Methods:
- Fabrication and characterization of an rf-SET.
- Measurement of rf-SET charge sensitivity.
- Assessment of rf-SET backaction on a Cooper-pair box qubit.
Main Results:
- Achieved a charge sensitivity of 6.3 micro-electrons/sqrt(Hz).
- Demonstrated minimal backaction of the rf-SET on the Cooper-pair box.
- Determined that qubit mixing time can exceed measurement time.
Conclusions:
- rf-SETs are suitable for high-fidelity charge qubit readout.
- Single-shot qubit state measurement is feasible with this technique.
- This readout method minimizes qubit state disturbance.
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