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Electron Channeling Contrast Imaging for Rapid III-V Heteroepitaxial Characterization
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Published on: July 17, 2015

Imaging of Friedel oscillation patterns of two-dimensionally accumulated electrons at epitaxially grown InAs(111) A

K Kanisawa1, M J Butcher, H Yamaguchi

  • 1NTT Basic Research Laboratories, 3-1 Wakamiya, Morinosato, Atsugi, Kanagawa 243-0198, Japan.

Physical Review Letters
|May 1, 2001
PubMed

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