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Spectroscopy with scanning near-field optical microscopy using photon tunnelling mode

S Takahashi1, M Futamata, I Kojima

  • 1Joint Research Center for Atom Technology-Angstrom Technology Partnership, National Institute for Advanced Interdisciplinary Research, Tsukuba, Ibaraki, Japan. takasa@jrcat.or.jp

Summary

This study demonstrates Raman spectroscopy with scanning near-field optical microscopy (SNOM) using photon tunneling. This technique enhances signal detection for materials like copper phthalocyanine without surface enhancement.

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