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Spectroscopy with scanning near-field optical microscopy using photon tunnelling mode
S Takahashi1, M Futamata, I Kojima
1Joint Research Center for Atom Technology-Angstrom Technology Partnership, National Institute for Advanced Interdisciplinary Research, Tsukuba, Ibaraki, Japan. takasa@jrcat.or.jp
Journal of Microscopy
|June 5, 2001
Summary
This study demonstrates Raman spectroscopy with scanning near-field optical microscopy (SNOM) using photon tunneling. This technique enhances signal detection for materials like copper phthalocyanine without surface enhancement.
Area of Science:
- Spectroscopy
- Nanotechnology
- Materials Science
Background:
- Raman spectroscopy provides valuable chemical information.
- Scanning near-field optical microscopy (SNOM) offers high spatial resolution.
- Integrating Raman spectroscopy with SNOM presents challenges in signal detection and probe interference.
Purpose of the Study:
- To demonstrate a novel method for performing Raman spectroscopy using scanning near-field optical microscopy (SNOM).
- To overcome limitations of existing SNOM Raman techniques, particularly probe-induced scattering.
- To obtain high-quality Raman spectra of materials under specific conditions.
Main Methods:
- Utilized photon tunneling mode in SNOM.
- Employed an attenuated total reflection (ATR) configuration for sample illumination.
- Employed a sharpened optical fiber probe to collect the evanescent wave perturbed by the sample.
- Minimized Raman scattering originating from the optical fiber probe.
Main Results:
- Successfully demonstrated Raman spectroscopy coupled with SNOM.
- Achieved significant reduction in Raman scattering from the optical fiber probe.
- Enabled excitation of the sample with higher intensity laser light compared to illumination mode SNOM.
- Obtained off-resonance Raman spectra of copper phthalocyanine (CuPc) without surface-enhanced Raman scattering (SERS).
Conclusions:
- The demonstrated photon tunneling SNOM technique is effective for acquiring Raman spectra.
- This method allows for enhanced excitation intensity and reduced probe interference.
- It provides a viable approach for analyzing materials like CuPc without relying on SERS.