Simulations of atomic level stresses in systems of buried Ge /Si islands

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Probing C84-embedded Si Substrate Using Scanning Probe Microscopy and Molecular Dynamics
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M A Makeev1, A Madhukar

  • 1Photonic Materials and Devices Laboratory, Department of Materials Science and Engineering, University of Southern California, Los Angeles, California 90089-0241, USA.

Physical Review Letters
|June 21, 2001
PubMed

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