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Published on: December 20, 2012
Development of a quantitative energy filtering TEM method to study a reactive NiO/80Ni20Fe interface
P Bayle-Guillemaud1, A Barbier, C Mocuta
1CEA-Grenoble, Département de Recherche Fondamentale sur la Matière Condensée, France. pbayle@cea.fr
Ultramicroscopy
|June 23, 2001
Summary
Energy filtering transmission electron microscopy (EFTEM) quantified chemical composition at a NiO/80Ni20Fe interface. This analysis revealed diffusion processes during annealing, with results validated by electron energy loss spectroscopy.
Area of Science:
- Materials Science
- Analytical Chemistry
- Surface Science
Background:
- Characterizing interfaces is crucial for understanding material properties.
- Quantitative elemental analysis in Transmission Electron Microscopy (TEM) is challenging.
Purpose of the Study:
- To develop and validate a method for quantitative chemical mapping of the NiO/80Ni20Fe interface using EFTEM.
- To determine the elemental composition and diffusion profiles across the annealed interface.
Main Methods:
- Energy Filtering Transmission Electron Microscopy (EFTEM) with the three-window technique.
- Quantitative analysis using reference areas and partial cross-section ratios.
- Validation via Electron Energy Loss Spectroscopy (EELS).
Main Results:
- Successfully mapped the elemental distribution (Fe, Ni, O) at the NiO/80Ni20Fe interface.
- Obtained quantitative composition profiles revealing diffusion during annealing.
- EFTEM results were in good agreement with EELS validation.
Conclusions:
- Relative quantification is achievable in EFTEM using internal reference areas.
- EFTEM provides reliable chemical composition data for reactive interfaces.
- The study demonstrates EFTEM's utility in analyzing diffusion phenomena in materials.
