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Diode-Laser Spectroscopy: Line Profiles of H(2)O in the Region of 1.39 &mgr;m
Muriel Lepère1, Annie Henry, Alain Valentin
1Laboratoire de Physique Moléculaire et Applications, CNRS, Université Pierre et Marie Curie, Tour 13, Case 76, 4 Place Jussieu, Paris Cedex 05, F-75252, France
Abstract:
Using a stabilized diode-laser spectrometer, we have studied the line profiles of water vapor near 7185.59 cm(-1). With low pressures of pure gas (=1,Torr) in a White-type cell, we have deduced the line intensities using the Voigt profile. This study shows clear differences between experimental and calculated lines described by a Voigt profile when the pressure increases. For water vapor in mixtures with N(2), O(2), Ar, or He, we have determined the collisional broadening coefficients, taking into account the collisional narrowing (Dicke effect). The narrowing parameters have been determined using soft (Galatry) or hard (Rautian and Sobel'man) collision models and compared to the dynamic friction coefficient. Copyright 2001 Academic Press.