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Related Experiment Videos

Front-end architecture for a multi-frequency electrical impedance tomography system.

D Jennings1, I D Schneider

  • 1Electronics Division, Cardiff School of Engineering, Wales, UK. jennings@cf.ac.uk

Medical & Biological Engineering & Computing
|July 24, 2001
PubMed
Summary

This review critically examines Electrical Impedance Tomography (EIT) hardware, analyzing errors and proposing a novel distributed, multi-frequency EIT system design with active electrodes for improved performance.

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Area of Science:

  • Electrical Engineering
  • Biomedical Imaging
  • Signal Processing

Background:

  • Electrical Impedance Tomography (EIT) is a developing imaging technique.
  • Existing EIT system hardware presents various design considerations and limitations.
  • Understanding hardware aspects is crucial for improving EIT system accuracy and functionality.

Purpose of the Study:

  • To critically review primary aspects of EIT system hardware in existing literature.
  • To extend the analysis of injection and measurement errors in EIT systems.
  • To propose a novel design for a distributed parallel multi-frequency EIT system.

Main Methods:

  • Literature review of EIT system hardware.
  • Analysis of current injection and measurement errors.

Related Experiment Videos

  • Design and description of a novel distributed parallel multi-frequency EIT system architecture.

    • Main Results:

    • Identification of key hardware aspects and associated errors in EIT systems.
    • A novel EIT system design is proposed, featuring modularity and active electrodes.
    • The proposed system utilizes digital current injection and digital signal demodulation for enhanced performance.

    Conclusions:

    • The proposed EIT system design offers potential improvements in Common Mode Rejection Ratio (CMRR) and overall system efficiency.
    • Digital signal processing techniques are integral to the novel EIT system's functionality.
    • This work contributes to the advancement of EIT hardware design and error analysis.