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Published on: February 12, 2013
An auto-tuning method for focusing and astigmatism correction in HAADF-STEM, based on the image contrast transfer
N Baba1, K Terayama, T Yoshimizu
1Department of Electrical Engineering, Kogakuin University, Tokyo, Japan. baban@sin.cc.kogakuin.ac.jp
Abstract:
An auto-tuning method for high-angle annular detector dark field scanning transmission electron microscopy (HAADF-STEM) is proposed which corrects the defocus to the optimum Scherzer focus and compensates the astigmatism. Because the method is based on the image contrast transfer function formulated for the HAADF-STEM, the defocus and the astigmatism are accurately measured from input of two different defocus images. The method is designed to work independent of object function in the linear imaging model by analysing the spectral ratio between two Fourier spectra of their images, which is useful for cases where the spectrum of object function is not uniformly spread out over the reciprocal space. The method was preliminarily tested in a Hitachi HD-2000 STEM, and successful results of the auto-tunings from the viewpoint of verification of the algorithm were obtained using general specimens of Au fine particles and a thin section of a semiconductor device.
