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Related Experiment Videos

Deglitching procedure for XAFS.

K N Zhuchkov1, V A Shuvaeva, K Yagi

  • 1Department of Physics, Rostov University, Rostov-on-Don, Russia. zkn@aaanet.ru

Journal of Synchrotron Radiation
|August 22, 2001
PubMed
Summary
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This study introduces a computer program to remove artifacts like glitches and Bragg peaks from polarized X-ray Absorption Fine Structure (XAFS) spectra, improving data quality for crystalline samples.

Area of Science:

  • Materials Science
  • Spectroscopy
  • Data Analysis

Background:

  • Polarized X-ray Absorption Fine Structure (XAFS) spectroscopy is a powerful technique for probing material structures.
  • Artifacts such as glitches and Bragg peaks can contaminate XAFS spectra, complicating analysis.
  • Bragg scattering from crystalline samples is a significant source of artifacts in polarized XAFS.

Purpose of the Study:

  • To develop and present a computer program for the effective elimination of artifacts from polarized XAFS spectra.
  • To enable straightforward identification and removal of Bragg scattering signals in EXAFS data.

Main Methods:

  • Development of a novel computer algorithm designed for artifact removal.
  • Implementation of procedures to locate and subtract artifactual signals, specifically Bragg peaks.

Related Experiment Videos

  • Testing the program on simulated spectra with introduced artifacts and experimental polarized XAFS data.

    • Main Results:

    • The developed program successfully identifies and removes artifacts, including glitches and Bragg peaks.
    • Demonstrated high effectiveness in cleaning both simulated and experimental polarized XAFS spectra.
    • The procedure allows for the isolation of true EXAFS signals from crystalline materials.

    Conclusions:

    • The presented computer program is an effective tool for enhancing the quality of polarized XAFS spectra.
    • This method significantly improves the reliability of data analysis for crystalline samples.
    • The software provides a valuable solution for researchers dealing with artifact-laden XAFS data.