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Updated: Jun 30, 2026

Probing C84-embedded Si Substrate Using Scanning Probe Microscopy and Molecular Dynamics
13:58

Probing C84-embedded Si Substrate Using Scanning Probe Microscopy and Molecular Dynamics

Published on: September 28, 2016

RETRACTED: High-temperature superconductivity in lattice-expanded C60

J H Schön1, C Kloc, B Batlogg

  • 1Bell Laboratories, Lucent Technologies, 600 Mountain Avenue, Murray Hill, NJ 07974, USA. hendrik@lucent.com

Science (New York, N.Y.)
|September 5, 2001
PubMed

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